ITL Grant Program (Measurement Science and Engineering Research Grants) is sponsored by National Institute of Standards and Technology (NIST) Information Technology Laboratory (ITL). The ITL Grant Program provides financial assistance for research or collaborative research consistent with ITL's mission, including in Artificial Intelligence, Big Data Analytics, Cybersecurity, and High-Performance Computing.

U.S. Department of Commerce, Notice of Funding Opportunity (NOFO), NIST, Measurement Science and Engineering (MSE) Research Grant Programs, Description: NIST is soliciting applications for financial assistance for Fiscal Year 2025 (FY25) within the following NIST grant programs: (1) Associate Director for Innovation and Industry Services (2) Associate Director for Laboratory Programs (ADLP); (3) CHIPS Research & Development Program Office (CRDO) ; (4) Communications Technology Laboratory (CTL); (5) Engineering Laboratory (EL); (7) Information Technology Laboratory (ITL); (8) International and Academic Affairs Office (IAAO); (9) Material Measurement Laboratory (MML); (10) NIST Center for Neutron Research (NCNR); (11) Physical Measurement Laboratory (PML); (12) Special Programs Office (SPO); and (13) Standards Coordination Office (SCO).

Funding Instrument: This funding opportunity will result in the award of grants or cooperative agreements. A grant or cooperative agreement is not the correct funding vehicle if the principal purpose is to provide products or services for the direct benefit or use of the 11. 04 2: CHIPS R&D , 11.

609: Measurement and Engineering Research and Standards, 11. 619: Arrangements for Interdisciplinary Research Infrastructure, and 11. 620: Science, Technology, Business and/or Education Outreach.

Performance : Project performance period of up to five (5) years.

Goals & Objectives: To support activities that develop, expand, strengthen, or sustain NIST partnership programs and/or support the conduct of research or a recipient's portion of collaborative research in a Page 2 of 71 variety of areas including, but not limited to: Metrology; Standards; Nanotechnology; Artificial Intelligence; Advanced Communications; Advanced Manufacturing; Promotion of U.S. innovation and industrial competitiveness; Measurements in Sciences; Neutron Research; and enhancing coordination of the U.S. Standards System with government and private sector Eligible Applicants: This NOFO is open to all non -Federal entities to include , institutions of higher education, non -profit organizations, for - profit organizations, state and local governments, Indian tribes, hospitals, foreign public entities, and foreign governments.

Individuals and unincorporated sole proprietors are not considered “non -Federal entities” and are not eligible to apply under this NOFO. NIST seeks to collaborate with a wide range of organizations and encourages minority -serving institutions of higher education and community colleges to apply. Funding Amount: See Section II.

in the Full Announcement Text of this NOFO. Requirements: The MSE Research Grant Programs do not require cost sharing and Times: Applications will be accepted and considered on a rolling basis as they are received. See Section IV.

4. in the Full Announcement Text of this NOFO. How to Apply: Applications must be submitted using Grants.

gov . Paper applications will not be accepted. See Section V.

2. in the Full Announcement Text of this NOFO. Programmatic and Technical Questions : See Section VII.

in the Full Announcement Text of this NOFO. Grant Rules and Regulations: See Section VII. in the Full Announcement Text of this NOFO.

Page 3 of 71 II. Federal Award Information 33 III. Eligibility Information 35 IV.

Application and Submission Information 36 V. Application Review Information 47 VI. Federal Award Administration Information 62 VII.

Federal Awarding Agency Contacts 69 VIII. Other Information 71 NIST’s mission is to promote innovation and industrial competitiveness by advancing measurement science, standards, and technology , including by funding extramural research .

This NOFO seeks applications for measurement science and standards research in the areas described by each MSE Grant Program below , which will support the development of a general population that understands and appreciates measurement science and standards. NIST seeks to collaborate with a wide range of organizations including but not limited to minority -serving i nstitutions and community colleges , in support of NIST's mission. 1.

Associate Director for Innovation and Industry Services (ADIIS) Grant Program The statutory authority for the ADIIS Grant Program is 15 U.S.C. § 272(b) and (c ), 15 U.S.C. § 278g -1(e) , and Title II, Division B, the Research and Development, Competition, and Innovation Act ( Pub.

L. 117 -167 ). Program Description : The ADIIS Grant Program supports activities that develop, expand, strengthen, or sustain NIST partnership programs within the ADIIS Directorate through measurements, standards, data, industry and technology studies, and technology research and developmen t (R&D).

Specifically, the ADIIS Grant Program seeks to support technology innovation and service to American industry in fields including bioscience , chemistry, dimensional metrology, electronics, engineering, infrastructure, information technology, manuf acturing, manufacturing metrology, materials science and engineering, nanotechnology, neutron research, optics, and physics.

The ADIIS Directorate’s current partnership programs include the Baldrige Page 4 of 71 Performance Excellence Program 1, the Hollings Manufacturing Extension Partnership (MEP) 2, programs within the NIST Office of Advanced Manufacturing 3, and programs within the NIST Technology Partnerships Office 4.

Financial assistance may be provided to bolster measurements, standards, data, and technology R&D within these partnership programs, or through new • advance early -stage research and development for industry; • enhance opportunities in manufacturing through innovation; • strengthen supplier programs for small and medium manufacturers; • encourage the transfer and commercialization of research and technology from institutions of higher education, federal laboratories, other federally funded research programs, and nonprofit research institutes, as well as research or evaluate the impacts of such transfer and commercialization; • create jobs or promote workforce development; and • realize or sustain metrology needs in American industry, including through technical metrology training programs for manufacturers.

Financial support may be provided for conferences, workshops, studies, workforce development activities , or technical R&D meetings that are relevant to advancing NIST partnerships in technology innovation and service to American industry. However, NIST cannot be an official sponsor or co -sponsor for any event funded through this program.

All applications submitted to the ADIIS Grant Program must be in accordance with the program objectives listed above. Financial support will not be provided for the establishment of an MEP Center or to augment the capabilities of an MEP Center through an MEP Center applicant.

Current MEP Centers may add capabilities to the MEP Program, including the development of projects to solve new or emerging manufacturing problems, through the rolling MEP Competitive Awards Program NOFO (see https://www. nist. gov/mep/nist -mep -competitive -awards -program -cap ).

> 1The Baldrige Program oversees the nation's only Presidential award for performance excellence while offering a > wide array of award -winning products and services, including the world -renowned Baldrige Excellence Framework. > See https://www. nist.

gov/baldrige for more information. > 2MEP is a public -private partnership with Centers in all 50 states and Puerto Rico dedicated to serving small and > medium -sized manufacturers. See https://www.

nist. gov/mep for more information . > 3The NIST Office of Advanced Manufacturing coordinates the network of Manufacturing USA institutes and leads the > interagency Advanced Manufacturing National Program Office.

See https://www. nist. gov/oam for more information.

> 4Programs within the NIST Technology Partnership Office include the NIST Technology Transfer Program, the Lab > to Market Initiative, and the Economic Analysis Program. See https://www. nist.

gov/tpo for more information. Financial support will not be provided for the NIST Small Business Innovation Research (SBIR) program. The NIST SBIR program solicits research and development proposals from small businesses that respond to specific technical needs described in the annual NIST SBIR Program NOFO.

Please visit the NIST SBIR Program webpage for more information: https://www. nist. gov/tpo/small - business -innovation -research -program .

Additional information about the ADIIS and ADIIS Programs may be obtained at https://www. nist. gov/adiis .

Bryana Head is the contact person for the ADIIS Grant Program, who can be contacted for clarification of the program objectives. She may be reached at (301) 975 -4885 or by e -mail at bryana. head@nist.

gov . 2. Associate Director for Laboratory Programs ( ADLP ) Grant Program The ADLP Grant Program's statutory authority is 15 U.S.C.

§ 272(b) and (c) , 15 U.S.C. § 278g -1(e) , and Title II, Division B, the Research and Development, Competition, and Innovation Act (Pub. L.

117 -167 ).

Program Description : The ADLP Grant Program provides financial assistance to support the conduct of research or a recipient’s portion of collaborative research consistent with the NIST mission in areas consistent with the interests of NIST research programs including but not limited to bioscience, communications, advanced manufacturing, artificial intelligence, resilience, quantum information science, etc. Financial support may be provided to organizations to sponsor individual participation in career devel opment and outreach programs in advance of the NIST mission and laboratory priorities.

Financial support may be provided for students to attend education and outreach programs, conferences, workshops, or other technical research meetings that are relevant to the mission of the ADLP. Financial support may also be provided to organizations sponsoring conferences, workshops, education and outreach programs, or other technical events that are relevant to the mission of the ADLP.

However, NIST cannot be an offi cial sponsor or co -sponsor for any event funded Additional information about the ADLP and ADLP Programs may be obtained at http://www. nist. gov/director/adlp.

cfm . All applications submitted to the ADLP Grant Program must be in accordance with the program objectives listed above. Stephanie Shaw is the contact person for the ADLP Grant Program, who may be contacted for clarification of the program objectives.

She may be reached at (301) 975 -2667 or by e -mail at stephanie. shaw@nist. gov .

3. CHIPS Research & Development Program Office (CRD O) Grant Program Page 6 of 71 The statutory authority for the CRD O Grant Program is 15 U.S.C. § 272(b) and (c), 15 U.S.C.

§§ 278g -1(e), 15 U.S.C. §§ 4651, 4656, and 4657, and Title II, Division B, the Research and Development, Competition, and Innovation Act Program Description: The CRDO supports advanced microelectronics research to advance the development of semiconductor technologies.

The CRDO is focused on establishing the capacity of inventing, developing, prototyping, and deploying the foundational semiconductor technologies of the future in the United States. The CRDO’s activities enable advances and breakthroughs in measurement science, standards, material characterization, instrumentation, testing, and manufacturing capabilities to ensure U.S. competit iveness and leadership in microelectronics.

The CRDO Grant Program provides financial assistance to support the conduct of research or a recipient’s portion of collaborative research consistent with the CRDO’s mission to support research in the following fields: semiconductor and microelectronics ma nufacturing , virtualization, and automation of semiconductor machinery , chiplets , co -design and simulation , and materials and substrates.

Additional information about the CRDO and CRDO Programs may be obtained at Research & Development Programs | NIST . All applications submitted must be in accordance with the program objectives listed below for the CRDO divisions. Crystal Murphy is the contact person for the CRDO Grant Program, who may be contacted for clarification of the program objectives.

She may be reached at (202) 697 -2117 or by e -mail at crystal. murphy@chips. gov .

a. CRDO Headquarters Office : Financial support may be provided for conferences, workshops, or other technical research meetings that are relevant to the mission of the CRDO. However, NIST cannot be an official sponsor or co -sponsor for any event funded through this program.

Support is generally provided in increments of $5,000 per award. Applications for other purposes may be considered. b.

CHIPS Metrology Program : All objectives of interest will focus on conducting the measurement science, or metrology, critical to the development of new materials, packaging, and production methods for semiconductors.

Specific objectives of interest include but are not limited to researching, developing, promoting, prototyping, measuring, and deploying emerging technologies, standards and test methods related to the following seven Metrology Grand Challenges, Page 7 of 71 identified in NIST’s Strategic Opportunities for U.S. Semiconductor Manufacturing: Facilitating U.S. Leadership and Competitiveness through Advancements in Measurements and Standards publication: • Metrology for Materials Purity, Properties, and Provenance : Measurement technologies, properties data, and standards focused on defect and contaminant identification to support uniform materials quality and traceability across the supply chain.

• Advanced Metrology for Future Microelectronics Manufacturing : Physical and computational metrology tools adaptable to next -generation manufacturing of advanced complex, integrated technologies , and • Enabling Metrology for Integrating Components in Advanced Packaging : Metrology for complex integration of sophisticated components and new materials to support a strong domestic advanced microelectronics packaging industry.

• Modeling and Simulating Semiconductor Materials, Designs, and Components : Advanced design simulators using multi -physics models and next -generation concepts such as artificial intelligence and digital twins, empowering U.S. microelectronics designers.

• Modeling and Simulating Semiconductor Manufacturing Processes : Advanced computational models, methods, data, standards, automation, and tools to enable domestic semiconductor manufacturers to improve yields, accelerate time to market, and enhance competitiveness.

• Standardizing New Materials, Processes, and Equipment for Microelectronics: Standards, validation tools, and protocols for next - generation materials, processes, and equipment, paving the way for accelerated innovation and cost -competitiveness in U.S. industry.

• Metrology to Enhance Security and Provenance of Microelectronic based Components and Products : Approaches to hardware security protection that includes standards, protocols, formal testing processes, and advanced computational technologies while providing avenues for assurance and provenance of microelectronic components across the supply chain an d end products.

Additional objectives include work on reference materials, reference data, and calibrations for the precision equipment used in chip manufacturing, and the development of standards for semiconductor processes and cybersecurity. c. Domestic Control , Domestic Production, and Research Security 1.

Domestic Control Page 8 of 71 In the event that intellectual property (see definition below) results from work funded under this program, the domestic control requirements pursuant to 15 U.S.C. § 4656(g), as explained in this section, shall apply to the award recipient For purposes of complying with 15 U.S.C. § 4656(g), the following definitions a.

“Intellectual property” means any invention that is or may be patentable b. “Foreign adversaries” includes, but is not necessarily limited to, any “foreign entity of concern” and “foreign country of concern,” as those terms are defined in 15 U.S.C. § 4651(7) -(8) and 15 C.

F. R. §§ 231.

102 and 231. 104 , as well as any entity whose actions, policies, or personnel decisions are controlled by a “foreign entity of concern” or “foreign country c.

“Domestic entity” includes: (1) a State, local, or Tribal government in the United States; and (2) any (for - or non -profit) entity that is (a) organized under the laws of the United States or any jurisdiction within the United States and (b) has a principal place of business in the United States.

The principal place of business generally means the place where an entity’s officers direct, control, and coordinate the entity’s activities A foreign adversary cannot be considered a domestic entity.

” The applicable domestic control requirements for any intellectual property produced under the award funded under this program include but are not limited Ownership : At least one U.S. entity must own or co -own any intellectual property (IP) created with this funding.

This entity must have the right to enforce IP rights for at least 3 years after either the project end date or the IP is disclosed to NIST, Post 3 years: The IP can generally be sold or transferred to a foreign entity, as long as the foreign entity is not a foreign adversary. Notification Requirement : If a U.S. entity plans to sell or transfer the IP, it must notify NIST before proceeding.

Foreign Adversaries Restriction: The IP cannot be sold, transferred, or licensed to a foreign adversary (with some exceptions as provided by NIST). Page 9 of 71 In the event the Recipient or a subrecipient violates the domestic control requirements pursuant to 15 U.S.C. § 4656(g), NIST may impose any remedy available under 2 CFR §§ 200.

339 -343. As set forth in 15 U.S.C. § 4656(g), the Department of Commerce must “develop policies to require domestic production, to the extent possible, for any intellectual property” resulting from R&D funded under this program.

In the case such intellectual proper ty is created under this award, domestic production requirements may apply, in addition to domestic manufacture r equirements under the Bayh -Dole Act , as applicable . Pursuant to 15 U.S.C. § 4657, no CHIPS Act funding under this program may be provided to a foreign entity of concern, as defined in 15 U.S.C.

§ 4651 and 15 C. F. R.

231. 103 and 231. 104.

For awards under the CHIPS Research & Development Office (CRDO) Grant Pr ogram, NIST also will apply the requirements of 42 U.S.C. § 6605 and certain requirements resulting from the promulgation of National Security Presidential Memorandum -33 (NSPM -33) and NSTC NSPM -33 Guidance issued in January 2022. As is described in Sections IV.

2. a. (7) and IV.

2. a. (12) of this NOFO, the Applicant must provide a resume/CV for each Senior/Key Person participating in the proposal, and each such individual also must complete a Current and Pending Support Form .

See also the budget -related requirements for Senior/Key personnel in Sections IV. 2. a.

(2)A. and IV. 2.

a. (7) of this NOFO . NIST will deem any individual listed as a Senior/Key Person in the Application to be a “covered individual”.

The term “covered individual” is defined as “an individual who (1) contributes in a substantive, meaningful way to the scientific development or ex ecution of a research and development project proposed to be carried out with a research and development award from a Federal research agency; and (2) is designated as a covered individual by the Federal research agency concerned,” as under 42 U.S.C. § 660 5(d)(1).

For any CRDO Grant Program application that may be selected for an award, t he NIST Research Security Office (RSO) will conduct a research security review.

In conducting this review, the NIST RSO will review the proposed project, and the Current and Pending Support Form (s) and Resume (s)/ CV (s) of covered individuals to assess whether the Applicant or any covered individuals are Page 10 of 71 subject to any undue foreign influence or interference through conflicts of interest or conflicts of commitment , including but not limited to any associations with any foreign country of concern 5 or malign foreign talent recruitment program .

6 At the conclusion of the research security review, the NIST RSO will issue and provide to CRDO a risk determination of a low, medium, or high risk of potential foreign interference or exploitation.

The risk determination may result in the applications not being funded, or the inclusion of Specific Award Conditions to mitigate any risks or to ensure compliance with all research security requirements, including but not limited to imposing a requirement: that each covered individual receive research security training and/or execute a Nondisclosure Agreement; that the Awardee provide a research security and/or technology control plan (see NIST Internal Reports (IRs) 8484 and 8481 ); and/or that intellectual property and domestic control measures be included.

4. Communications Technology Laboratory (CTL) Grant Program The statutory authority for the CTL Grant Program is 15 U.S.C. § 272(b) and (c) , 15 U.S.C.

§ 278g -1(e) , 15 U.S.C. § 278n -1, 15 U.S.C. § 3706 , 42 U.S.C.

§ 17385 , and Title II, Division B, the Research and Development, Competition, and Innovation Act ( Pub. L. 117 -167 ).

Program Description: The Communications Technology Laboratory (CTL) plays a vital role in ensuring that American industry can satisfy the growing global need for broadband technologies and applications through the accelerated development, testing, and deployment of advanced co mmunications and connected systems technologies for commercial and government applications.

The CTL Grant Program provides financial assistance to support the conduct of research or a recipient’s portion of collaborative research consistent with the CTL mission in the broad areas of public safety research, RF technologies, wireless networks includi ng 6G and beyond, smart connected systems, quantum communications including both network and components, spectrum sharing and sensing, and space communications.

Additional information about the CTL and CTL Programs may be obtained at www. nist. gov/ctl .

All applications submitted must be in accordance with the program objectives listed below for the five CTL divisions. Kristine Tadros is the > 5The term "foreign country of concern" means the People's Republic of China, the Democratic People's > Republic of Korea, the Russian Federation, the Islamic Republic of Iran, or any other country > determined to be a country of concern by the Secretary of Stat e. 42 U.S.C.

§ 19237(2) . > 6See definition at 42 U.S.C. § 19237(4) .

contact person for the CTL Grant Program . She may be reached at ( 303 ) 501 - 3701 or by e -mail at kristine. tadros @nist .

gov . a. CTL Office.

Financial support may be provided for conferences, workshops, or other technical research meetings relevant to the CTL's mission . However, NIST cannot be an official sponsor or co -sponsor for any event funded through this program. Applications for other purposes may be considered.

b. Public Safety Communications Research Division . Specific objectives of interest include but are not limited to researching, developing, promoting, measuring, and deploying emerging technologies and standards that enhance the ability of first responders and others leveraging a Public Safety Communications network during standard and emergency operations.

c. RF Technologies Division.

Specific objectives of interest include but are not limited to researching, developing, promoting, measuring, and deploying emerging technologies and standards in fundamental microwave quantities, high -speed microelectronics, superconducting electronics, electromagnetic compatibility, electromagnetic field characterization, antenna metrology, electromagnetic properties of materials, electrical hardware security, and radio frequency communications systems.

Additional objectives include quantum networks, characterization of microwave circuits at cryogenic temperatures, superconducting integrated circuits for precision measurement and fundamental standards, such as for DC and AC voltage, impedance, signal synthesis, RF reference sources for wireless communications, and quantum advanced computing. Methods employed are both experimental and theoretical and include multivariate d.

Wireless Networks Division. Specific objectives of interest include , but are not limited to , researching, developing, promoting, measuring, and deploying emerging technologies and standards related to how wireless networks are designed, managed , and used .

Additional objectives include conducting theoretical and experimental research in communication networks, protocols, digital communication systems, and components; utilizing analytical and empirical approaches, developing simulation models, experimental testbeds , and proof of concept prototypes to evaluate new technologies and refine standard specifications for wireless and core networks and systems; and developing metrics and measurement methods to assess the performance and trustworthiness of wireless and core systems.

e. Smart Connected Systems Division. Specific objectives of interest include but are not limited to, researching, developing, promoting, Page 12 of 71 measuring, and deploying emerging technologies, standards, and test methods for trustworthy autonomous systems, cloud networks, and quantum f.

Spectrum Technology and Research Division . Specific objectives of interest include but are not limited to , research, development, and deployment of innovative measurement methods and tools to promote novel and efficient use of the electromagnetic optical spectra through improved access, sharing, atmospheric sensing, and precision timing.

Additional objectives include the following: wireless co -ex istence; Artificial Intelligence /Machine Learning (AI/ML ) applied to closed -box systems testing; microwave noise metrology; RF spectrum sensing; fiber optic combs applications in atmospheric spectr oscopy, time synchronization, chemical analysis, and telecommunications; and development and deployment of spectrum -efficient and spectrum -sharing technologies, including support of the National Advanced Spectrum and Communications Test Network (NASCTN).

5. Engineering Laboratory (EL) Grant Program The statutory authorities for the EL Grant Program are 15 U.S.C. § 272(b) and (c), 15 U.S.C.

§ 278g -1(e) , 15 U.S.C. § 278n -1, 15 U.S.C. § 278n -2, 42 U.S.C.

§ 7701 et seq. , 42 U.S.C. § 15701 et seq ; and Title II, Division B, the Research and Development, Competition, and Innovation Act (Pub.

L. 117 -167 ).

Program Description: The EL Grant Program provides financial assistance to support the conduct of research or a recipient’s portion of collaborative research consistent with the EL’s mission to support research in the following fields: advanced manufacturing; additive manufacturing; robotics and autonomous systems ; intelligent systems ; and information systems integration for applications in manufacturing; polymeric materials ; heating, ventilation, air conditioning, and refrigeration (HVAC & R) equipment performance; building mechanical systems and controls; building envelope and material performance; energy conversion systems ; premise plumbing and water use; indoor air quality and ventilation ; and applied economics.

Financial support may be provided for conferences, workshops, or other technical research meetings that are relevant to th e mission of EL. However, NIST cannot be an official sponsor or co -sponsor for any event funded through this program. Additional information about the EL and EL Programs may be obtained at www.

nist. gov/el . The EL Grant Program supports the EL mission to promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology for engineered systems in ways that enhance economic security and improve quality of life.

Ty pical funded activities may include measurement science research ; development of performance metrics, tools, and Page 13 of 71 methodologies for engineering technologies and applications ; and critical technical contributions to standards and code development. All applications submitted must be in accordance with the program objectives listed below.

The appropriate EL Program Manager for each EL field of research described in this Section may be contacted for clarification of the program objectives. The contact person for the EL Grant Program is Jason Averill , who may be reached at (301) 975 -2585 or by e -mail at jason. averill @nist.

gov . a. Applied Economics Office.

The primary objective is to provide standardized methods, economic models, training programs and materials , and expert technical consulting in support of resource allocation decisions . The office uses techniques such as benefit -cost analysis, life -cycle costing, multi -criteria decision analysis , life -cycle assessment, decision science, and econometrics to evaluate new technologies.

The contact person is David Butry who may be reached at (301) 975 -6136 or by e -mail at david. butry@nist. gov .

b. Materials and Structural Systems Division. The primary objective is to collaborate with or conduct research consistent with the division’s programs in infrastructure materials, buildings and infrastructure systems, community resilience , and codes and standards.

Applications for financial assistance are sought that address es either one of the following specific subject areas or that addresses more than a single subject area with a cross -cutting, interdisciplin ary research team : 1) Infrastructure Materials: There are emergent concrete degradation mechanisms that originate in the coarse or fine aggregate component of a concrete mixture.

These mechanisms may arise from inadequate standardized testing for the specific aggregate mineral features that may lead to expansion and cracking. The measurement challenge is typically associated with aggregate characteristics, or the critical quantity of aggregate required to cause damage.

There are also measurement challenges with using new construction methods, including additive 2) Buildings and Physical Infrastructure: Degradation of construction materials , in turn , affect s performance, structural integrity, resilience, and sustainability of the built environment, and measurement science to quantify the effects of degradation mechanisms on overall service life, structural safety, and resilience of physical systems in the U.

S . is still a major challenge. Measurement challenges include accurate characterization of extreme natural hazards ( e.g., hurricane wind and storm surge, tornado es, flood ing , and earthquake s), developing risk - consistent design criteria for the built environment, science -based Page 14 of 71 accounting for future changes to natural hazards, building and infrastructure performance, and life -cycle prediction.

3) Community Resilience: Community resilience considers the integrated performance of buildings and infrastructure systems for future hazard events and under adverse conditions and the consequences and impacts on populations, social systems, and economics of a community or region.

Measurement challenges include integrated modeling of physical, social, economic, and natural systems; metrics and indicators at a community scale for decision makers; economic assessments of costs and benefits over a future specifie d time period; and methods to address future changes to natural hazards. The contact person for this division is Aron Newman , and he may be reached at (301) 975 -5965 or by e -mail at c.

Building Energy and Environment Division. The primary objective is to collaborate with or conduct research consistent with the laboratory programs in areas related to measurement science needed to enable high -performance buildings.

The breadth of this area includes measurement science associated with the building envelope, HVAC equipment, energy generation and delivery systems, building controls/building automation systems, building water systems, and strategies to improve indoor air quality. Applications for financial assistance are sought that would: (1) Provide measurement science for high -performance buildings.

Measurement systems, approaches, and predictive models are required that can help to enable high -performance buildings.

A primary objective is to develop measurement methods and approaches, data, and predictive models to assess the effectiveness of buildin g enclosures from a thermal and airtightness perspective ; the performance of indoor space conditioning systems ; the performance of energy generation and delivery systems, indoor air quality ; and water efficiency and quality in buildings.

Additionally, an objective is to develop techniques to assess buildings on a whole -building scale. These techniques could involve standards, system interactions, and multiple factors that can be considered to represent high performance . The contact person is William Healy , and he may be reached at (301) 975 -4922 or by e -mail at william.

healy@nist. gov . (2) Enable improved building operations through embedded intelligence in building controls.

Next -generation metrics and tools are needed that enable the development and deployment of building automation and control systems with embedded intelligence that improve building system operation.

A primary objective is to develop measurement methods, Page 15 of 71 models, and algorithms/tools suitable for embedding in building control system products that enable better or more automated system commissioning, automated fault detection and diagnostics, improved system -level optimization, and integration of building sy stems with a smart electrical grid.

Additionally, an objective is to conduct research that provides a basis for new industry standards for intelligent buildi ng systems. Th e contact person is William Healy , and he may be reached at (301) 975 -4922 or by e -mail at william. healy@nist.

gov . (3) Develop metrics/tools for building evaluation. Next -generation metrics and tools enabling rigorous assessment of performance over the building service life are needed to link building technology innovation to economic benefits.

A primary objective is the development of databases and/or models for estimating component and